Publications

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2018
Lenthe, W., J.C. Stinville, M. Echlin, Z. Chen, S. Daly, and T. Pollock. "Advanced Detector Signal Acquisition and Electron Beam Scanning for High Resolution SEM Imaging." Ultramicroscopy 195 (2018): 93-100.
Chen, Z., W. Lenthe, J.C. Stinville, M. Echlin, T.M. Pollock, and S. Daly. "High-Resolution Deformation Mapping Across Large Fields of View Using Scanning Electron Microscopy and Digital Image Correlation." Experimental Mechanics (2018): 1-15.