Advanced detector signal acquisition and electron beam scanning for high resolution SEM imaging

William C.Lenthe, Jean Charles Stinville, McLean P. Echlin, Zhe Chen, Samantha Daly, Tresa M.Pollock

is now out in Ultramicroscopy. Open access until October 31st is available at: 

https://authors.elsevier.com/c/1XihK15DbnKFIH